19. May 2026
09:05 – 09:20
3D Heterogeneous Integration
Results of the survey on “Failure Analysis, Testing, and Metrology” conducted as part of the concerted action—Roadmapping HTAD and the Microelectronics Strategy of the Federal Government
Jacob Hornung
VDI/VDE Innovation + Technik GmbH I Germany
Abstract
In January and February 2026, VDI/VDE Innovation + Technik GmbH conducted a survey on the topics of failure analysis, testing, and metrology on behalf of the Federal Ministry of Research, Technology, and Space (BMFTR), the results of which are to be used as part of the Concerted Action “Roadmapping Microelectronics Strategy and High-Tech Agenda.” To continue involving the community in the process, the results of the survey will be presented here at the CAM-Workshop.
Biography
Since 2022: Scientific Advisor at VDI/VDE Innovation + Technik GmbH
2021: Ph.D. in Physics
2017–2021: Research Associate at the Helmholtz-Zentrum Dresden-Rossendorf