Kristof Croes

Silicon photonics, a technology where optical and electronic components are integrated on the same platform, is rapidly growing from a small niche to a technology enabler for higher speed data transmission in data centers, telecommunications, and high-performance computing.  Such fast growing field poses challenges and opportunities for the reliability and failure analysis engineers working in this field. This presentation overviews such challenges and opportunities encountered in the context of imec’s Silicon Photonics reliability research. For each developed device (being photo diodes, modulators, heaters, lasers, …), the related degradation mechanisms will be introduced together with their proposed testing and qualification methodologies and failure analysis challenges. The basics of each device will be introduced in detail such that the presentation can be followed by a broader audience with interests in reliability and failure analysis.

Lorem ipsum dolor sit amet, consectetuer adipiscing elit. Aenean commodo ligula eget dolor. Aenean massa. Cum sociis natoque penatibus et magnis dis parturient montes, nascetur ridiculus mus. Donec quam felis, ultricies nec, pellentesque eu, pretium quis, sem.

Nulla consequat massa quis enim. Donec pede justo, fringilla vel, aliquet nec, vulputate eget, arcu. In enim justo, rhoncus ut, imperdiet a, venenatis vitae, justo. Nullam dictum felis eu pede mollis pretium. Integer tincidunt. Cras dapibus. Vivamus elementum semper nisi. Aenean vulputate eleifend tellus. Aenean leo ligula, porttitor eu, consequat vitae, eleifend ac, enim. Aliquam lorem ante, dapibus in, viverra quis, feugiat a, tellus