Rostam-Khani
20. May 2026 13:40 – 14:00 Artificial Intelligence and Digitalization Bringing Physics of Degradation Methodology in Board Level Vibration Testing Patrick Rostam-Khani NXP Semiconductors I The Netherlands Abstract Zero-failure strategies in mission critical applications are pushing reliability towards physics-of-degradation driven reliability testing, beyond the current state-of-the-art test methods. This session presents a highly accelerated vibration…