Neel Leslie

Electron beam probing has emerged as an emerging technique in the field of failure analysis, offering unparalleled insights into probing capabilities and characterization of semiconductor devices. This talk will explore the diverse techniques of electron beam probing, focusing on its role in identifying defects, timing marginalities, and other applications.

Neel Leslie graduated from San Jose State University with a BS in Chemistry. He joined DCG Systems as a development engineer, and later moved to Applications. He eventually managed an Applications Engineering team responsible for Circuit Edit, Nanoprobing, Optical Fault Isolation, and Lock-in Thermography products. He is currently the product marketing manager in charge of the E-beam probing systems at Thermo Fisher Scientific. Neel has worked at the Thermo Fisher Scientific for over 10 years.