Leo Svenningsson

Semiconductor failure analysis increasingly benefits from machine learning, but individual organizations often lack enough data to build robust and accurate models. At the same time, building databases across companies is typically restricted due to intellectual property and confidentiality concerns. Federated Learning provides a collaborative approach where multiple partners can jointly train a machine learning model without sharing their underlying data. This talk introduces the fundamentals of Federated Learning and explains how it enables failure analysis partners to combine knowledge from distributed datasets while keeping proprietary data local.

Dr. Leo Svenningsson is researcher at RISE, Research Institutes of Sweden, working on AI-driven methods for electronics failure analysis and reliability.