Lukas Uhlig

Photonics components exhibit at least electrical and optical functional properties, as in transceivers or image sensors for instance. In addition, mechanical functions may come to the fore, as it is the case e.g.with mechanically controllable filters or micro scanners. Characterization and testing methods are therefore highly complex, with the generation and detection of electrical signals and optical radiation, the measurement of motion, and material and surface properties playing a major role.
Photonics is becoming commercially attractive for high-speed communication, imaging across a wide wavelength range (UV… MIR), sensor technology, and even for interconnecting chiplets within a microsystem, as well as for quantum computing. The development of efficient testing methods is therefore becoming increasingly important. This contribution discusses various methods for characterizing different photonic components used in sensor technology, information transmission, and quantum technology, illustrating these with examples and addressing the measurement of electrical, optical, and mechanical properties. Finally, it explores a concept for a universally applicable photonic testing system.

Dr. Lukas Uhlig is a researcher in the field of integrated photonics and quantum technologies at the Fraunhofer Institute for Electronic Nano Systems (ENAS). He studied physics at TU Chemnitz and received his PhD in 2025 with a thesis on the dynamical behavior of nitride-based laser diodes. Since 2025, he is working at Fraunhofer ENAS on the design, simulation, and characterization of integrated photonic components, and on ion traps for quantum computing. He published over 20 peer-reviewed papers and contributed to over 15 scientific conferences, including two invited talks. He was awarded the Springer Thesis Award and the TU Chemnitz University Prize 2025.