21. May 2025 08:00 – 09:00 Tutorial Deep level effects, failure modes and mechanisms of GaN HEMTs; current understanding and open questions Enrico Zanoni University of Padova I Italy Abstract This tutorial will review recent results concerning deep levels in GaN HEMT, their physical origin, their effects on device operation, the experimental techniques adopted for…
20. May 2025 15:00 – 15:20 Emerging Fault Isolation Techniques Precise 3D Defect Localization in quantitative Lock-in Thermography by analyzing the spatial phase distribution Sebastian Brand Fraunhofer IMWS I Germany Abstract Ongoing advances in functionality and computational performance of microelectronic devices require continuation in the developments in the underlying technologies for e.g., interconnect and packaging…