20. May 2025 17:30 – 17:40 Vendor Session Thermo Fisher Scientific FA Road Map Ondrej Baco Thermo Fisher Scientific Brno s.r.o I Czech Republic Abstract With more than four decades innovating physical and electrical analysis solutions for the electronics industry. Thermo Fisher Scientific is one of the world’s premier providers of ultra-highresolution tools for imaging…
21. May 2025 16:00 – 16:20 AI Applications and FA Workflows Enhancing Semiconductor Nanoprobing procedures with AI-Driven Tip Detection David Kleindiek Kleindiek Nanotechnik I Germany Abstract The automation of nanoprobing application relies on the accurate detection of probe tips in scanning electron microscope (SEM) images. This work explores the application of deep learning models to…
20. May 2025 12:00 – 12:20 MEMS & Sensors Pinpointing Leakage Defects in TSVs: A Refined Failure Analysis Approach Georg Spanring ams-OSRAM AG I Austria Abstract In 3D integrated circuit (IC) design, Through-Silicon Vias (TSVs) form vertical metal connections that pass entirely through a silicon wafer or die. They enable stacking and direct integration of…
20. May 2025 14:20 – 14:40 Emerging Fault Isolation Techniques Innovative Approaches to Ultra Thinning Silicon to Enabling New Insights in IC Failure Analysis Michael DiBattista Varioscale, Inc. I US Abstract Integrated Circuit (IC) backside sample preparation is a critical step in semiconductor failure analysis eabling fault isolation to improve yield and investigate design modifications.…
20. May 2025 17:20 – 17:30 Vendor Session Efficiency Meets Precision: Advanced Laser Solutions for Sample Preparation Oytun Tasgit 3D-Micromac AG I Germany Abstract Integrating femtosecond laser technology has significantly advanced sample preparation, offering unprecedented precision and speed. The microPREP® PRO FEMTO system exemplifies this innovation, utilizing ultrashort pulse lasers to enable athermal ablation with…
21. May 2025 11:00 – 11:20 GaN Electronics Defect characterization in compound semiconductors using cathodoluminescence Marc Fouchier Attolight I Switzerland Abstract Cathodoluminescence (CL) consists in the analysis of the light emitted in the UV-IR range by a material upon its excitation with an electron beam. This technique is particularly useful in compound semiconductors, such as…